Theoretical background of SPM
- 1. Scanning Tunnel Microscopy (STM)
- 2. Scanning Force Microscopy (SFM)
- 2.1 Cantilever
- 2.2 Cantilever-Sample Force Interaction
- 2.3 Linear Oscillations of Cantilever
- 2.4 Non-linear Oscillations of Cantilever
- 2.5 Ultimate Resolution in Contact Mode
- 2.6 Probe-Sample Interaction: Lateral Forces
- 2.7 Magnetic Force Microscopy: Quantitative Results Treatment
- 2.7.1 MFM general concept
- 2.7.2 Algorithms for the physical parameters of the sample obtaining
- 2.7.3 Interaction of the hard magnetic cantilever with the magnetic field of the studied sample (general case)
- 2.7.4 Dipole effective magnetic moment approximation
- 2.7.5 Effective monopole magnetic charge approximation
- 2.7.6 Interaction between soft magnetic probe and magnet sample
- 2.7.7 Interaction between paramagnetic probe and magnet sample
- 2.7.8 Methods of magnet probe parameters estimation
- 2.7.9 Magnetic field of rectangular conductor with current
- 2.7.10 Magnetic field of ring with current
- 2.7.11 Magnetic field of cylinder domains
- 2.7.12 Magnetic field of periodic parallel domains
- Appendices
- 3. Scanning Optical Microscopy
- 4. Flash models