Si-Si Wu, Teng-Xiang Huang, Xiaolan Xu, Yi-Fan Bao, Xin-Di Pei, Xu Yao, Mao-Feng Cao, Kai-Qiang Lin, Xiang Wang, Dongdong Wang, and Bin Ren
Quantitatively Deciphering Electronic Properties of Defects at Atomically Thin Transition-Metal Dichalcogenides
ACS Nano 2022, 16, 4786−4794
https://doi.org/10.1021/acsnano.2c00096
Keywords-Subjects:
Spectroscopy (AFM/Raman), transition-metal dichalcogenides, tip-enhanced photoluminescence, defects, exciton, doping, strain, TEPL
18.10.2022