Easy to use technology enabling multiple AFM/STM capabilities and delivering world class performance
Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.
Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast one-click cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.
Coupled with the PX Ultra controller and newest Nova PX data processing software, NEXT realizes the largest suite of AFM and STM techniques both for beginner and advanced users. NEXT provides 60+ modes and techniques in basic configuration.
Powerful and flexible PX Ultra controller allows high-quality AFM operations with small deflection noise (~25 fm/√Hz), low-noise high voltage drive (noise <1 mV/600 V) and multi-frequency measurements with five lock-in amplifiers.
Nova PX software contains predefined settings and smart algorithms for fast configuration of the NEXT operation in all advanced modes. Along with fast configuration Nova PX software allows researchers to have unlimited experiment flexibility.
Contact AFM and AM-AFM (semicontact and non-contact modes) are available for topography measurements with the option of viewing several relevant signals.
Analysis of data curves of various nature (distance relations of force, amplitude, frequency, phase, or current, as well as bias voltage relations of force or current) supplies a vast amount of diverse information on the sample.
NEXT offers a wide variety of electric measurement techniques, including Electrostatic force microscopy with amplitude and frequency modulation, Kelvin probe force microscopy with amplitude or phase modulation, measurement of dC/dZ and dC/dV relations, quantitative probing of dielectric properties and Spreading resistance imaging.
STM measurements can be performed in the modes of constant current or of constant height. STM spectroscopy provides relations I(V), I(Z), dI/dV, and dI/dZ.
For MFM measurements, the two-pass mode with tracking the sample surface topography and the mode of constant height in the scanner coordinate frame are implemented.
NEXT allows much room for material research by its nanosclerometry feature. Quantitative measurements of hardness and Young modulus are available with Berkovich-type probes and commercial AFM cantilevers depending on the properties of the sample.
With its wide variety of techniques and modes of probe measurements, the NEXT measurement complex is applicable for many challenges in science and technology. Scanning with atomic resolution that by NEXT can offer is of high demand in physicochemical research of solid surfaces, low-dimensional nanostructures, and nanomaterials.
Surface morphology analysis provides parameters of roughness, texture, and anisotropy of the sample surface as well as distributions of adsorbed particles and geometrical characteristics of those particles.
Dedicated gentle scanning techniques are now available to study powders, soft materials, biological structures, biomolecules, biopolymers, and to perform measurements in liquid.
A peculiar place in applications of NEXT is taken by material science. It includes study of adhesion characteristics, friction factors, wear resistance of coatings, elasticity moduli, hardness etc.
Wide variety of techniques for measurement of electrical characteristics implemented in NEXT (local resistance, surface potential, capacitance, photovoltaic parameters) enables analysis of various functional structures, components of micro-, nano- and molecular electronics, and sensors of many types.
NEXT offers comprehensive capabilities to study ferroelectrics in terms of their domain structure, hysteresis properties, and thermal characteristics.
Measuring in liquid
Auxiliary measuring head and open liquid cell for measuring in liquid
Nanosclerometry head
Auxillary head for
Heating stage
Temperature control of the sample: from the RT up to 150°C
Joystick
AFM probes
NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others:
contact, conductive contact, noncontact and conductive noncontact.
In air
Contact and Amplitude Modulation AFM, AFM Spectroscopy, AFM Lithography (force, current, voltage), HybriD Mode™, Spreading-Resistance Imaging, Dark mode SRI, Lateral Force Microscopy, Lateral modulation LFM, Vertical and Lateral Piezoresponse Force Microscopy, PFM Switching Spectroscopy, Force Modulation Microscopy, Magnetic Force Microscopy, Two-pass and Single-pass Electrostatic Force Microscopy, Two-pass and Single-pass Scanning Capacitance Force Microscopy, Quantitative Permittivity mapping, Two-pass and Single-pass Kelvin Probe Force Microscopy, Scanning Tunnelling Microscopy (microscopy, spectroscopy, lithography), Nanosclerometry, AFM-based nanoindentation.
In liquid
Contact and Amplitude Modulation AFM, AFM Spectroscopy, AFM Force Lithography, HybriD™ mode, Lateral Force Microscopy, Lateral modulation LFM, Force Modulation Microscopy, Magnetic Force Microscopy.
| Measuring system | |
| Measuring heads | AFM and STM (stationary, automatically interchangeable); liquid AFM, and nanosclerometer head (removable, with manual insertion) |
| Available SPM modes | AFM, STM, nanosclerometry in air environment AFM in liquid environment |
| System of cantilever deflection registration | automated alignment |
| Sample | |
| Size | up to 20 mm in diameter, up to 10 mm in height |
| Sample weight | up to 40 g |
| Temperature control | from RT up to 150 oC |
| Scanning system | |
| Type of scanning | by sample |
| Scanning area | 100x100x10 um (with feedback sensors) 3x3x2 um in the high resolution mode |
| Nonlinearity, XY | 0.1 % (with feedback sensors) |
| Resolution | |
| Noise XY | less than 0.3 nm (with feedback sensors) |
| Noise level Z (RMS in the band of 10 -1000 Hz) | 0.03 nm (typically) with feedback sensors 0.02 nm in the high resolution mode |
| System of sample positioning | |
| Method | automated, video monitored |
| Range, XY | 5x5 mm |
| Min. step | 0.3 um |
| Video monitoring system | |
| Resolution | 2 um |
| Focus | motorized |
| Zoom | continuous |
| Overall dimensions and weight | |
| Sizing | 470x210x260 mm |
| Weight | 25 kg |
