AFM Features

Empowering simultaneous mapping of various material properties.

The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.

Speed up your AFM by an order of magnitude.

NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.

Cutting-edge AFM-RAMAN-SICM System for Biological Studies

Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.

Atomic Force Microscope for in situ nondestructive testing in industrial settings

Make amplitude modulation AFM easy for researchers of every skill level.