+1-480-493-0093
Leading the Way in Nanoscale Analysis
Products
Applications
Resources
About us
Contact us
AFM Probes shop
Ask online
Home
Resources
SPM Theory
Theoretical background of SPM
1. Scanning Tunnel Microscopy (STM)
1. Scanning Tunnel Microscopy (STM)
1.1 STM Physical Backgrounds
1.1.1 Tunneling Effect
1.1.2 Tunneling Effect in Quasiclassical Approximation
1.1.3 Metal Energy-Band Structure
1.2 Tunnel Current in MIM System
1.2.1 John G. Simmons Formula
1.2.2 John G. Simmons Formula in a Case of Small, Intermediate and High Voltage (Field Emission Mode).
1.2.1 Appendix
1.3 «Observed» Physical Quantities in STM
1.3.1 Current-Voltage Characteristic
1.3.2 Current-Distance Characteristic
1.3.3 Measurements of the Electronic States Density
1.3.4 Work-Function Distribution Study
Have more questions? Contact us
or fulfill a form and we will answer all your questions.
Ask an Expert
Send us your request
For technical support please use our
Ask Online system
* - Required fields.
Send
Accept privacy policy
