+1-480-493-0093
Leading the Way in Nanoscale Analysis
Products
Applications
Resources
About us
Contact us
AFM Probes shop
Ask online
Home
Resources
SPM Theory
Theoretical background of SPM
2. Scanning Force Microscopy (SFM)
2.1 Cantilever
2.1 Cantilever
2.1.1 The Hooke's law
2.1.2 Deflections under the vertical (normal) force component
2.1.3 Deflections under the longitudinal force
2.1.4 Deflections under the transverse force
2.1.5 Cantilever inverse stiffness tensor
2.1.6 Effective mass and eigenfrequency of the cantilever
Have more questions? Contact us
or fulfill a form and we will answer all your questions.
Ask an Expert
Send us your request
For technical support please use our
Ask Online system
* - Required fields.
Send
Accept privacy policy