+1-480-493-0093
Leading the Way in Nanoscale Analysis
Products
Applications
Resources
About us
Contact us
AFM Probes shop
Ask online
Home
Resources
SPM Theory
Theoretical background of SPM
2. Scanning Force Microscopy (SFM)
2.6 Probe-Sample Interaction: Lateral Forces
2.6 Probe-Sample Interaction: Lateral Forces
2.6.1 The nature of frictional forces
2.6.2 Cantilever deformations under the influence of lateral forces
2.6.3 Calibration of the optical detection system
2.6.4 Qualitative interpretation of results
2.6.5 Stick-slip motion on the nanoscale
2.6.6 Stick-slip phenomenon on the microscale
2.6.7 Appendices
Have more questions? Contact us
or fulfill a form and we will answer all your questions.
Ask an Expert
Send us your request
For technical support please use our
Ask Online system
* - Required fields.
Send
Accept privacy policy
