Publications

Y.-R. Ma, C. Yu, Y.-D. Yao, Y. Liou, and S.-F. Lee. Tip-induced local anodic oxidation on the native SiO₂ layer of Si(111) using an atomic force microscope. Physics Review B, 2001, Volume 64, pp. 195324.

H. Uji-i, K. Hatanaka, J. Hobley, and H. Fukumura.
Nanospark at the interface between organic solvents and tin-doped indium oxide.
APPLIED PHYSICS LETTERS VOLUME 79, NUMBER 16.

V.N. Konopsky, K.E. Kouyanov, N.N. Novikova. Investigations of the interference of surface plasmons on rough silver surface by scanning plasmon near-field microscope. Ultramicroscopy, 2001, Vol.88, pp. 127

Rostislav V. Lapshin.
Digital data readback for a probe storage device.
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 71, NUMBER 12, pp. 4607-4610, 2000

Konopsky V.N. Operation of scanning plasmon near-field microscope with gold and silver tips in tapping mode: demonstration of subtip resolution. Optics Communications, 2000, Vol. 185, pp. 83-93.

Yu.M. Yevdokimov, V.I. Salyanov, B.M. Mchedlishvili, V.A. Bykov, A.V. Belyaev, S.A. Saunin, F. Spener, M. Palumbo. Double-stranded nucleic acids in liquid-crystalline dispersions as building blocks for cross-linked supramolecular structures. Nucleosides, Nucleotides & Nucleic Acids, 19, 1355 (2000).

E.A. Mazurina, I.V. Myagkov, S.V. Ayrapetiants, V.V. Losev, A.T. Dembo. Mono- and multilayers from heptadecylcarboxy-tetrathiofulvalen modified by the surface-inactive electron acceptors. Molecular Materials, 2000, Vol. 12, pp. 27-43.

V.R. Novak, V.V. Zhizhimontov, A.V. Belyayev, V.A. Bykov. Surface Morphology of Arachidic Acid

A. Kikuieshi, V. Palyok, M. Slliplyak, I.A. Szabo, D.L. Beke. Photo-induced surface deformation during hologram recording in a-Se films. Journal of Optoelectronics and Advanced Materials, Vol. 2, No. 1, March 2000, pp. 95-98.

L. M. Blinov, V. M. Fridkin, S. P. Palto, A. V. Bune, P. A. Dowben, S. Ducharme. Two-Dimensional Ferroelectrics (Review). Physics progress, Mart 2000, Volume 170, Issue 3, pp. 245-262.

Michael D. Garrison, Todd C. McDevitt, Reto LuginbuK hl, Cecilia M. Giachelli, Pat Stayton, Buddy D. Ratner.
Quantitative interrogation of micropatterned biomolecules by surface force microscopy.
Ultramicroscopy 82 (2000) 193-202

V.A. Bykov, S.V. Lemeshko, S.A. Saunin. Local oxidation of the surface of the semi-conductors and metals solid-state probe SPM in the semicontact mode scanning as perspective method of the creation of the elements nanoelectronics. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 308-314.

V.A. Bykov, V.V. Dremov, V. Losev, S.A. Saunin, G.M. Mihailov. Probes "Whisker type" and magneto-force probes for SPM. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 298-302.

A.M. Alekseev, V.A. Bykov, A.I. Buzin, S.A. Saunin. Application of the multimode SPM methods for research of the polymers. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 287-291.

V.I. Povstugar, S.G. Bystrov, S.F. Lomaeva, S.S. Mihaylova. Means fixation of the fine particle for AFM research. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 march 2000, IPN RAS, pp. 337-341.

R.V. Gaynutdinov, A.I. Vilensky, A.L. Tolstikhina. AFM research of the fine structure of the track in the irradiated high-energy ions Xe films polyethyleneterephthalat. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 187-191.

V.A. Bykov, S.N. Kacur, B.K. Medvedev, S.A. Saunin, D.U. Sokolov. The mode dynamic force in SPM and results of the research. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 274-278.

A.A. Mojanova, N.I. Nurgazizov, A.A. Bukharaev. Study of the liquid etching of the dioxide silicon the use of atomic-force microscope by various temperature. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 207-211.