Publications

I. Grekhov, L. Delimova, I. Liniichuk, A. Lyublinsky, I. Veselovsky, A. Titkov, M. Dunaevsky, V. Sakharov. Growth mode study of ultrathin HTSC YBCO films on YBaCuNbO buffer. Physica C 324 1999 39

A. Kikineshi, V. Palyok, A. Mishak, I.Szabo, D.L.Beke. Surface relief formation at hologram recording in a-Se/As₂S₃ nanolayered films. Functional materials, V.6, No.3, pp. 413-417.

P.A. Arutunov, A.L. Tolstikhina. Atomic force microscopy in the problems of the of the designing devices for micro- and nanoelectronics. Part I. Microelectronics, 1999, Volume 28, Issue 6, pp. 405-414.

P.A. Arutunov, A.L. Tolstikhina. Atomic force microscopy in the problems of the of the designing devices for micro- and nanoelectronics. Part II. Microelectronics, 1999, Volume 29, Issue 1, pp. 13-22.

D.V. Klinov, V.V. Prohorov, V.V. Demin, Institute of the bioorganic chemistry RAS. Formation of the lipidic monolayer by means of the AFM-probe. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 263-269.

A.K. Vorob'eva, N.V. Vostokov, S.V. Gaponov, E.B. Kluenkov, V.L. Mironov, IPM RAS. Investigation of the heterogeneities in the Y-Ba-Cu-O thin films the use of scanning probe microscopy. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 290-295.

D.V. Klinov, T.V. Dobrinina, O.V. Nekrasova, V.G. Korobko, Institute of the bioorganic chemistry RAS. Atomic-force microscopy of the DNA-repressor systems. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 256-257.

D.V. Klinov, N. Macko, V.V. Demin, A.A. Mankin, Institute of the bioorganic chemistry RAS. Investigation of the bacteriophage FKZ the use of AFM and STM. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 258-262.

V.A. Bykov, V.V. Losev, S.A. Saunin. Capacitive technique of the scanning force microscopy in the recearch of the alloying dopant distribution in the silicon. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 134-140.

A.A. Bukharaev, A.A. Mojanova, N.I. Nurgazizov, D.V. Ovchinnikov, KPTI KSC RAS. Atomic-force microscopy of the nanostructured materials by selective chemical triplication. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 91-97.

N.V. Vostokov, D.G. Volgunov, V.F. Driahlushin, A.U. Klinov, V.V. Rogov, P.V. Shashkin, IPM RAS. Research of the metods atomic-force microscopy for creation of the nanosizeable elements. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 190-192.

D.V. Klinov, V.V. Prohorov, T. Neretina, V.V. Demin, D.I. Cherniy, E.D. Sverdlov, IBC RAS. Mapping of the DNA the use of atomic-force microscopy. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 145-151.

A.A. Bukharaev, A.A. Mojanova, N.I. Nurgazizov, KPTI KSC RAS. Analysis of the in situ photochemical prosesses ot the border liquid - semi-conductor the use of atomic-force microscope. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 85-90.

A.L. Tolstikhina, A.L. Belugina, S.A. Shikin, IC RAS. Research of the domain structure of ferroelectric TGS crystals the use of AFM. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 237-242.

A.A. Bukharaev, D.V. Ovchinnikov, N.I. Nurgazizov, R. Veyzendanger, KPTI KSC RAS. Hysteresis properties of the nanoparticles by experimental data of the magnetic force microscopy. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 mart 1999, IPN RAS, pp. 203-208.

A.L. Tolstikhina, P.A. Arutunov, IC RAS. Investigation of the morphology TiO2 films the use of AFM. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 250-255.

V.A. Bykov, A.V. Ikonnikov, S.N. Kacur, S.A. Saunin, NT-MDT. Electronics and software of the NT-MDT universal scanning probe microscopes. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 327-333.

S.L. Visocky, A.S. Djumaliev, M.L. Kac, I.G. Torgashev, U.A. Filimov, A.U. Cipin, R.K. Ifarov, Saratov branch of the IRE RAS. Influence of the roughness of the GaAs (100) substrate on the magnetic properties of the epitaxial Fe films. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 302-304.

V.A. Bykov, B.K. Medvedev, D.U. Sokolov, V.V. Losev, NT-MDT. Multimode Ultra-High Vacuum SPM Solver-UHV. Materials of the All-Russian conference "Probe microscopy - 1999". Nizhni Novgorod, 10-13 March 1999, IPN RAS, pp. 320-326.