Publications

N.V. Vostokov, V.D. Danilzev, U.N. Drozdov, A.V. Murel, O.I. Hrykin, V.I. Shashkin. Generating and research of the metallic nanoobjects Al on GaAs. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 176-179.

V.A. Bykov, A.D. Volkov, V.V. Zhizhimontov, S.A. Saunin, A.V. Ikonnikov. Perspectives of the combination of the SPM methods and spectroscopy technology for research substance. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 303-307.

A.M. Dorfman, A.M. Lahovich, V.I. Povstugar, S.G. Bystrov. Research of the plasmohardened inhibited protective coat on the iron the use of scanning probe microscopy and spectroscopy. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 80-84.

S.F. Lomaeva, V.I. Povstugar, S.G. Bystrov, S.S. Mihaylova. AFM research of the nanocrystalline powder on basis of the iron. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 75-79.

A.L. Tolstikhina, A.L. Belugina, U.V Astahova, R.V. Gaynutdinov. AFM research of the fine structure of the surface of the ferroelectric crystal TGS. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 65-69.

N.I. Nurgazizov, A.A. Bukharaev, D.V. Ovchinnikov, A.A. Mojanova. Visualization of the physical-chemical processes at the border of the liquid - solid the use of atomic-force microscope. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 40-47.

O.V. Karban, S.G. Bystrov, E.I. Salamatov. Garnet structure features revealed method atomic-force microscopy. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 232-236.

N.V. Vostokov, S.V. Gaponov, V.L. Mironov, A.I. Panphilov, N.I. Polushkin, N.N. Salachenko, A.A. Fraerman, M.N. Haidl. Finding of the effective surface roughness and angular dependence of the reflectance in the range X-rays by experimental data of the atomoc-force microscopy. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 107-112.

A.L. Tolstikhina, N.V. Belugina and S.A. Shikin. AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale. Ultramicroscopy, Volume 82, Issue 1-4, 2000, pp. 149-152.

U.A. Adamov, N.V. Korneev, V.G. Mocerov, V.K. Nevolin. Forming and electric properties of the planar 2D-nonodimension structures. Microsystem technics, 2000, No 1, pp. 13-16.

V.A. Bykov. Micromechanics for Scanning Probe Microscopy and nanotechnology. Microsystem technics, 2000, No 1, pp. 21-33.

N.V. Vostokov, S.A. Gusev, I.V. Dolgov, U.N. Drozdov, Z.F. Kracilnik, D.N. Lobanov, L.D. Moldavskay, A.V. Novikov, V.V. Postnikov, D.O. Filatov. Elastic stress and composition of the autogamous nanoislets GeSi on Si (001). Physics and technics semi-conductor, 2000, Volume 34, Issue 1, pp. 8-12.

R. Maoz, E. Frydman, S. R. Cohen, J. Sagiv. Constructive Nanolithography: Site-Defined Silver Self-Assembly on Nanoelectrochemically Patterned Monolayer Templates. Advanced Materials, Volume 12, Issue 6, 2000, pp. 424-429.

A. Rothschild, S.R. Cohen, R. Tenne. WS₂ nanotubes as tips in scanning probe microscopy. Applied Physics Letters, Volume 75, Number 25, 20 December 1999.

S. Gavrilov, S. Lemeshko, V. Shevyakov, V. Roschin. A study of the self-aligned nanometre scale palladium clusters on silicon formation process. Nanotechnology, 10 (1999) 213-216.

A.V. Ankudinov, A.N. Titkov, T.V. Shubina, S.V. Ivanov, P.S. Kop'ev, H.-J. Lugauer, G. Reuscher, M. Keim, A. Waag, G. Landwehr. Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes. Appl.Phys.Lett. 75(17), p.2626 (1999)

D. Sentenac, A. L. Demirel, J. Lub, and W. H. de Jeu*. A New Lamellar Morphology of a Hybrid Amorphous/Liquid Crystalline Block Copolymer Film. Macromolecules 1999, 32(10), 3235-3240

A.V. Ankudinov, V.P. Evtihiev, V.E. Tokranov, V.P. Ulin, A.N. Titkov. Nanorelief of the oxidated surface of the chip grating rotational heterlayers Ga0.7Al0.3As and GaAs. Physics and technics semi-conductor, 1999, Volume 33, Issue 5, pp. 594-597.

P.A. Arutunov, A.L. Tolstikhina, V.N.Demidov. System of parameters for roughness and microrelief of the surface materials analysisin the scanning probe microscopy. "Factory laboratory. Materials diagnostics.", Volume 9, Issue 65, pp. 27-37.