V.A.BYKOV, D.A.EVPLOV, V.K.IVANOV. Metrological properties of PZT-26 ceramics SPM scanners in XY-plane and comparison between PZT-26 and PZT-19. SPM-2002, Proceedings. P. 280
V.A.BYKOV, S.A.SAUNIN, I.V.DUSHKIN, A.V.MEZIN. Second mode (190 kHz) of the vibration of the turning fork application in shear-force measurements. SPM-2002, Proceedings. P. 258
A.A.FRAERMAN, S.V.GAPONOV, B.A.GRIBKOV, V.L.MIRONOV, N.N.SALASHCHENKO. Determination of the X-ray mirror component angle dependence and effective surface roughness on the basis of AFM measurements. SPM-2002, Proceedings. P. 235
V.V.VOLKOV, R.L.KAYUSHINA, V.A.LAPUK, A.L.TOLSTIKHINA, R.V.GAYNUTDINOV, E.V.SHTYKOVA, D.I.SVERGUN. Determination of low resolution structure of human immunoglobulin M and rheumatoud factor IgM-RF in solution. SPM-2002, Proceedings. P. 220
V.G.DEDKOV, V.V.OBUKHOVA, N.N.BELUSHKINA, A.E.EFIMOV. Scannig probe study of human blood mitochondria immersed in sucrose buffer solution on mica substrate. SPM-2002, Proceedings. P. 178
S.G.BYSTROV, A.A.SHAKOV, A.V.ZHIKHAREV. Probe modifications and development of model samples for use in chemical force microscopy. SPM-2002, Proceedings. P. 163
A.G.TEMIRYAZEV, M.P.TIKHOMIROVA, I.FEDOROV, V.ROSCHIN, V.SHEVYAKOV. Investigation of yttrium iron garnet film with optical and magnetic force microscopy. SPM-2002, Proceedings. P. 129
Y.N.DROZDOV, S.V.GAPONOV, B.A.GRIBKOV, D.V.MASTEROV, V.L.MIRONOV, Y.N.NOZDRIN, N.V.VOSTOKOV. SPM investigations of the morphology features and local electric properties of the HTS YBaCuO thin films. SPM-2002, Proceedings. P. 117
A.M.LYAKHOVITCH, A.V.DORFMAN, M.A.SHYROBOKOV. Characteristics of films obtained in plasma of some saturated hydrocarbons. AFM investigation. SPM-2002, Proceedings. P. 114
G.L.PAKHOMOV, N.V.VOSTOKOV, V.M.DANILTSEV, V.I.SHASHKIN. AFM study of dry etched cleavages of AlxGa1-xAs/GaAs heterostructures. SPM-2002, Proceedings. P. 89
A.ANKUDINOV, A.TITKOV, V.EVTIKHIEV, E.KOTELNIKOV, V.KOZLOV, N.BAZHENOV, G.ZEGRYA, H.HUHTINEN, R.LAIHO. Electrostatic force microscopy of Si- and GaAs- based device structures. SPM-2002, Proceedings. P. 19