NT-MDT Spectrum Instruments has prepared a scientific digest on PFM

Piezoresponce Force Microscopy (PFM) is an AFM mode which probes the mechanical deformation of a sample in response to an electric field which is applied between tip and sample. It allows to visualize ferroelectric domains, perform direct measurement of piezoelectric coefficients, study the dynamics of domain walls, etc. with high spatial resolution. These studies are essential for understanding the nature of new functional materials and devices for optoelectronics, data storage, medical diagnostics, actuators, etc.
In this scientific digest we present the collection of most remarkable works done by the world leading scientific groups during last two years in the field of PFM with the help of our instrumentation.