NT-MDT SI Exhibits at MRS Fall Meeting & Exhibit 2021
25.12.2021
NT-MDT Spectrum Instruments would like to thank all participants and organizers of the Fall MRS conference held last week in Boston. It was a great show, all visitors of our booth were impressed with our developments in AFM area, especially with new program module for automated scanning in AM-AFM – ScanT™. It allows automatic maintenance of attractive (non-contact) & repulsive (intermittent-contact) regimes and artifact-free scanning without parachuting effect.
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