Topography and single-pass PM-KPFM image of 100nm graphene monolayers on the end of each SiC step (bright 100 nm lines of surface potential picture). According to KPFM measurement typical variation between layers is 140 mV (or 270 mV in case of two monolayers)
Device: NEXT
Tip: NSG01/Pt
Sample Courtesy: Noelle Gogneau, University Paris Sud LPN (Laboratory of Photonic and Nanostructures)
Image Courtesy: Arseny Kalinin
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