Versatile AFM and Raman studies of Graphene Flakes

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Graphene flakes on gold substrate

AFM, KPFM, LFM, EFM, FMM, Raman and Rayleigh maps measured simultaneously by means of NTEGRA SPECTRA in upright configuration.

Data courtesy:
E. Kuznetsov, S. Timofeev, P. Dorozhkin, NT-MDT Co.

Confocal Raman map: G-band intensity

Confocal Raman microscopy.

G-band intensity map.
size: 30x30 um

Rayleigh

Rayleigh
size: 30x30 um

Confocal Raman map: 2679-2770

1500-1668 band
size: 30x30 um

KPFM

KPFM
size: 30x30 um
SPM principle: Kelvin Probe Force Microscopy

LFM

LFM
size: 30x30 um
SPM principle: Lateral Force Imaging

Height

AFM
size: 30x30 um
SPM principle: Intermittent contact mode

EFM

EFM
size: 30x30 um
SPM principle: EFM

Phase

size: 30x30 um
SPM principle: Phase Imaging mode

FMM

FMM
size: 30x30 um
SPM principle: Force Modulation microscopy

Связанные материалы

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