Publications

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08.12.2003

M. Savvateev, N. Kozlovskaya, M. Moisenovich, A. Tonevitsky, I. Agapov, V. Bykov, M. Kirpichnikov. Atomic force microscopy for investigation of ribosome-inactivating proteins' type II tetramerization. 12 International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM 2003). Book of abstracts. July 21-25, 2003. Eindhoven, the Netherlands. Mo-Pos-11.

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07.12.2003

M. Savvateev, N. Kozlovskaya, M. Moisenovich, A. Tonevitsky, I. Agapov, N. Maluchenko, V. Bykov, and M. Kirpichnikov. Atomic Force Microscopy for Investigation of Ribosome-inactivating Proteins- Type II Tetramerization. AIP Conference Proceedings. V. 696, 2003, P. 428.

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07.12.2003

A. H. Barber, C. Cooper, S. Cohen, H.D. Wagner. SPM probing of interfacial strengths of individual carbon nanotubes in a polymer matrix. 12 International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM 2003). Book of abstracts. July 21-25, 2003. Eindhoven, the Netherlands. Tu-6-C2.

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06.12.2003

A.H. Barber, S.R. Cohen, H.D. Wagner. Measurement of carbon nanotube

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06.12.2003

D. Azulay, M. Eylon, O. Eshkenazi, D. Toker, M. Balberg, N. Shimoni, O. Millo, and I. Balberg. Electrical-Thermal Switching in Carbon-Black

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02.12.2003

J. Liu, M.D. Hou, C. Trautmann, R. Neumann, C. Muller, Z.G. Wang, Q.X. Zhang, Y.M. Sun, Y.F. Jin, H.W. Liu, H.J. Gao.
STM and Raman spectroscopic study of graphite irradiated by heavy ions.
Nuclear Instruments and Methods in Physics Research B 212 (2003) 303

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01.12.2003

Ju-Hung Hsu, Hsin-Wen Lai, Heh-Nan Lin,Chia-Chih Chuang, and Jin-Hua Huang.
Fabrication of nickel oxide nanostructures by atomic force microscope
nano-oxidation and wet etching.
J. Vac. Sci. Technol. B 21(6), 2003, P. 2599-2601.

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30.11.2003

D. Toker, D. Azulay, N. Shimoni, I. Balberg, and O. Millo. Tunneling and percolation in metal-insulator composite materials. Phys.Rev.B. 68, 2003, 041403(R).

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30.11.2003

A. Kirsanov, A. Kiselev, A. Stepanov, N. Polushkin.
Femtosecond laser-induced nanofabrication in the near-field
of atomic force microscope tip.
JAP 94, (2003) 6822--6826.

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30.11.2003

M. Tian, J. Loos. Organisation and melting of solution grown truncated lozenge polyethylene single crystals. e-Polymers 2003, no. 051. http://www.e-polymers.org

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10.11.2003

R. Neffati, A. Alexeev, S. Saunin, J. C. M. Brokken-Zijp, D. Wouters, S. Schmatloch,
U.S. Schubert, J. Loos. Automated Scanning Probe Microscopy as a New Tool
for Combinatorial Polymer Research: Conductive Carbon Black/Poly(dimethylsiloxane) Composites. Macromol. Rapid Commun. 2003, 24, 113

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10.11.2003

V.A. Bykov, Yu.A. Novikov, A.V. Rakov, S.M. Shikin
Defining the parameters of a cantilever tip AFM by reference structure.
Ultramicroscopy 96 (2003) 175

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09.11.2003

N.I. Polushkin, K.V. Rao, J. Wittborn, A.M. Alexeev, A.F. Popkov. Visualization of small magnetic entities by nonmagnetic probes of atomic force microscope. JMMM 258-259 (2003) 29-31.

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03.11.2003

A. Alexeev, V.A. Bykov, A.F. Popkov, N.I. Polushkin, V.I. Korneev. Remanent state studies of elliptical magnetic particles. JMMM258-259 (2003) 42-44.

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02.11.2003

D. V. Ovchinnikov and A. A. Bukharaev.
The Computer Analysis of MFM Images of Separate Ferromagnetic Nanoparticles.
AIP Conference Proceedings Vol 696(1), 634-641 (2003)

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01.11.2003

D. V. Ovchinnikov and A. A. Bukharaev.
Computer simulation application for improving correctness of data obtained by magnetic force microscope.
Proceedings of SPIE, Micro- and Nanoelectronics -2003, Vol. 5401, pp. 642-647 (2003).

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01.11.2003

A.A. Bukharaev, D.A. Biziaev, P.A. Borodin, D.A. Ovchinnikov
Magnetic force microscopy of magnetization reversal of microstructures in situ in the external field of up to 2000Oe
Proceedings of SPIE, Micro- and Nanoelectronics -2003, Vol. 5401, pp 555-560 (2003).

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01.11.2003

L. Wilkens, D. Tra

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31.10.2003

M.S.Dunaevskii, A.V.Ankudinov, Z.F.Krasilnik, D.N.Lobanov, A.V.Novikov, R.Laiho, A.N.Baranov, D.A.Yarekha, P.Girard and A.N.Titkov. Visualization of buried nanoislands in GeSi/Si and nSb/GaSb heterostructures by Cross- Sectional Atomic Force Microscopy. 11th Int. Symp. "Nanostructeres: Physics and Technology", St Petersburg, Russia, June 23-28, 2003. P. 1-4.

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09.10.2003

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