Peter Hermann, Michael Hecker, Dmytro Chumakov, Martin Weisheit, Jochen Rinderknecht, Artem Shelaev, Pavel Dorozhkin, Lukas M. Eng
Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy
Ultramicroscopy 111(2011)1630–1635
04.08.2011