Webinar “NTEGRA Marlin: Bringing SICM to Your Research”

NT-MDT Spectrum Instruments is happy to invite you to our new webinar “NTEGRA Marlin: Bringing SICM to Your Research”.

Introduced more than 3 decades ago by Hansma et al., Scanning Ion Conductance Microscopy (SICM) has been developed by different groups and companies. However, the progress of SICM becoming a common tool for studies at the nanoscale, like one that happened to AFM, was quite slow due to different technological reasons.

The technological breakthrough was introduced by group of scientists and engineers lead by Prof. Yuri Korchev. Honed in electrical, software and mechanical aspects SICM has become enough fast, reliable and simple to be used in common applications. Combined with NT-MDT technologies the system has been empowered by combination with AFM and Raman and introduced as a joint product of NT-MDT Spectrum Instruments and ICAPPIC Inc. as NTEGRA Marlin.

During the webinar, our lecturer Prof. Korchev will introduce a wide range of SICM applications to biological and local electrochemical studies.

Webinar will take place on Tuesday, March the 17th 4-5 PM GMT (9-10 AM PST).

Presenter: Prof. Yuri Korchev, Imperial College London

Please check your time zone at the registration page.