SPM-2019-RCWDFM Joint International Conference

August 25-28, 2019

NT-MDT Spectrum Instruments is delighted to announce our participation at SPM-2019-RCWDFM from the 25th to 28th of August 2019 at Ural Federal University, Ekaterinburg.

SPM-2019-RCWDFM Joint International Conference will combine the 3rd International Conference "Scanning Probe Microscopy" (SPM), the 4th Russia-China Workshop on Dielectric and Ferroelectric Materials (RCWDFM), International Youth Conference “Functional Imaging of Nanomaterials”, and exhibition of nanotechnological equipment.

Among the invited speakers is Honorary President of NT-MDT Spectrum Instruments Viktor Bykov with the report "Scanning probe microscopy and nanoscale resolution spectroscopy achievements".

Visit the SPM-2019-RCWDFM Joint International Conference website by clicking the following link:
https://nanocenter.urfu.ru/spm2019rcwdfm

For more information on upcoming NT-MDT Spectrum Instruments events and exhibitions please follow link:
http://www.ntmdt-si.com/about/events